Recently, defect detection systems using artificial intelligence (AI) sensor data have been installed in smart factory manufacturing sites. However, when the manufacturing process changes due to ...

KLA (NasdaqGS:KLAC) is reporting strong and sustained market share gains in semiconductor inspection equipment. These gains are linked to its leading edge inspection technology and industry leading ...

Photo-induced force microscopy (PiFM) is a sophisticated nanoscale characterization approach that combines the elevated spatial resolution of atomic force microscopy (AFM) with infrared (IR) ...

System reliability and safety are paramount across industries such as semiconductors, energy, automotive, and steel, where even microscopic cracks or defects within structures can critically affect ...