PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.

Abstract: The degradation of underwater images is typically caused by absorption and scattering of light during its propagation in water, leading to color shifts and a decrease in contrast. To ...

Abstract: This paper presents the design of an intelligent image recognition algorithm based on optical sensors and Generative Adversarial Networks (GAN). In today’s digital era, the growth of image ...