IEEE

A novel LCD driver testing technique using logic test channels

Abstract: This paper proposes a novel voltage measurement technique for LCD driver testing by the use of the logic test channel of an ATE. The method is able to ...
IEEE

Power Prediction of RTL-Level Circuits by Using Machine Learning

Abstract: This paper proposes a power prediction framework by using machine learning (ML), which extracts the Hamming distance of the signals from the VCD file generated by RTL simulation as the power ...