Abstract: High-speed wafer testing is a difficult problem in the automated mass production testing of integrated circuits. A vertical probe card for high-speed wafer test is designed in this paper.

Rani Mukerji has returned as Shivani Shivaji Roy six years later, post-Mardaani 2, but the run has been underwhelming so far. During the opening weekend, the film displayed a decent trend, with ...

Pokemon TCG Pocket Handy Card Collection event will be available from January 30, 2026, to April 27, 2026. Players can gain solo battle points to get some useful cards. The cards are mostly Trainers ...

Abstract: Debt collection is utilized for risk control after credit card delinquency. The existing rule-based method tends to be myopic and non-adaptive due to the delayed feedback. Reinforcement ...

Nicole Kidman has dipped back into her wig collection for Paris Fashion Week, after letting her natural curls breathe in Australia over Christmas. The movie star, 58, was spotted wearing a hair topper ...

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Copyright 2026 The Associated Press. All Rights Reserved. Copyright 2026 The Associated Press. All Rights Reserved. Chanel’s ethereal first Haute Couture collection ...