Abstract: With the rapid advancement of 5G networks, billions of smart Internet of Things (IoT) devices along with an enormous amount of data are generated at the network edge. While still at an early ...
Abstract: MEMS devices suffer from errors in manufacturing processes such as lithography, etching, thinning, etc. These errors cause non-negligible deviations between the actual device performance and ...
一些您可能无法访问的结果已被隐去。
显示无法访问的结果